内容简介
1 Introduction to Analog Design
1.1 Why Analog?
1.2 Why Integrated?
1.3 Why CMOS?
1.4 Why This Book?
1.5 General Concepts
1.5.1 Levels of Abstraction
1.5.2 Robust Analog Design
2 Basic MOS Device Physics
2.1 General Considerations
2.1.1 MOSFET as a Switch
2.1.2 MOSFET Structure
2.1.3 MOS Symbols
2.2 MOS I/V Characteristics
2.2.1 Threshold Voltage
2.2.2 Derivation of I/V Characteristics
2.3 Second-Order Effects
2.4 MOS Device Models
2.4.1 MOS Device Layout
2.4.2 MOS Device Capacitances
2.4.3 MOS Small-Signal Model
2.4.4 MOS SPICE models
2.4.5 NMOS versus PMOS Devices
2.4.6 Long-Channel versus Short-Channel Devices
3 Single-Stage Amplifiers
3.1 Basic Concepts
3.2 Common-Source Stage
3.2.1 Common-Source Stage with Resistive Load
3.2.2 CS Stage with Diode-Connected Load
3.2.3 CS Stage with Current-Source Load
3.2.4 CS Stage with Triode Load
3.2.5 CS Stage with Source Degeneration
3.3 Source Follower
3.4 Common-Gate Stage
3.5 Cascode Stage
3.5.1 Folded Cascode
3.6 Choice of Device Models
4 Differential Amplifiers
4.1 Single-Ended and Differential Operation
4.2 Basic Differential Pair
4.2.1 Qualitative Analysis
4.2.2 Quantitative Analysis
4.3 Common-Mode Response
4.4 Differential Pair with MOS Loads
4.5 Gilbert Cell
5 Passive and Active Current Mirrors
5.1 Basic Current Mirrors
5.2 Cascode Current Mirrors
5.3 Active Current Mirrors
5.3.1 Large-Signal Analysis
5.3.2 Small-Signal Analysis
5.3.3 Common-Mode Properties
6 Frequency Response of Amplifiers
6.1 General Considerations
6.1.1 Miller Effect
6.1.2 Association of Poles with Nodes
6.2 Common-Source Stage
6.3 Source Followers
6.4 Common-Gate Stage
6.5 Cascode Stage
6.6 Differential Pair
Appendix A:Dual of Miller’s Theorem
7 Noise
7.1 Statistical Characteristics of Noise
7.1.1 Noise Spectrum
7.1.2 Amplitude Distribution
7.1.3 Correlated and Uncorrelated Sources
7.2 Types of Noise
7.2.1 Thermal Noise
7.2.2 Flicker Noise
7.3 Representation of Noise in Circuits
7.4 Noise in Single-Stage Amplifiers
7.4.1 Common-Source Stage
7.4.2 Common-Gate Stage
7.4.3 Source Followers
7.4.4 Cascode Stage
7.5 Noise in Differential Pairs
7.6 Noise Bandwidth
8 Feedback
8.1 General Considerations
8.1.1 Properties of Feedback Circuits
8.1.2 Types of Amplifiers
8.2 Feedback Topologies
8.2.1 Voltage-Voltage Feedback
8.2.2 Current-Voltage Feedback
8.2.3 Voltage-Current Feedback
8.2.4 Current-Current Feedback
8.3 Effect of Loading
8.3.1 Two-Port Network Models
8.3.2 Loading in Voltage-Voltage Feedback
8.3.3 Loading in Current-Voltage Feedback
8.3.4 Loading in Voltage-Current Feedback
8.3.5 Loading in Current-Current Feedback
8.3.6 Summary of Loading Effects
8.4 Effect of Feedback on Noise
9 Operational Amplifiers
9.1 General Considerations
9.1.1 Performance Parameters
9.2 One-Stage Op Amps
9.3 Two-Stage Op Amps
9.4 Gain Boosting
9.5 Comparison
9.6 Common-Mode Feedback
9.7 Input Range Limitations
9.8 Slew Rate
9.9 Power Supply Rejection
9.10 Noise in Op Amps
10 Stability and Frequency Compensation
10.1 General Considerations
10.2 Multipole Systems
10.3 Phase Margin
10.4 Frequency Compensation
10.5 Compensation of Two-Stage Op Amps
10.5.1 Slewing in Two-Stage Op Amps
10.6 Other Compensation Techniques
11 Bandgap References
11.1 General Considerations
11.2 Supply-Independent Biasing
11.3 Temperature-Independent References
11.3.1 Negative-TC Voltage
11.3.2 Positive-TC Voltage
11.3.3 Bandgap Reference
11.4 PTAT Current Generation
11.5 Constant-Gm Biasing
11.6 Speed and Noise Issues
11.7 Case Study
12 Introduction to Switched-Capacitor Circuits
12.1 General Considerations
12.2 Sampling Switches
12.2.1 MOSFETS as Switches
12.2.2 Speed Considerations
12.2.3 Precision Considerations
12.2.4 Charge Injection Cancellation
12.3 Switched-Capacitor Amplifiers
12.3.1 Unity-Gain Sampler/Buffer
12.3.2 Noninverting Amplifier
12.3.3 Precision Multiply-by-Two Circuit
12.4 Switched-Capacitor Integrator
12.5 Switched-Capacitor Common-Mode Feedback
13 Nonlinearity and Mismatch
13.1 Nonlinearity
13.1.1 General Considerations
13.1.2 Nonlinearity of Differential Circuits
13.1.3 Effect of Negative Feedback on Nonlinearity
13.1.4 Capacitor Nonlinearity
13.1.5 Linearization Techniques
13.2 Mismatch
13.2.1 Offset Cancellation Techniques
13.2.2 Reduction of Noise by Offset Cancellation
13.2.3 Alternative Definition of CMRR
14 Oscillators
14.1 General Considerations
14.2 Ring Oscillators
14.3 LC Oscillators
14.3.1 Crossed-Coupled Oscillator
14.3.2 Colpitts Oscillator
14.3.3 One-Port Oscillators
14.4 Voltage-Controlled Oscillators
14.4.1 Tuning in Ring Oscillators
14.4.2 Tuning in LC Oscillators
14.5 Mathematical Model of VCOs
15 Phase-Locked Loops
15.1 Simple PLL
15.1.1 Phase Detector
15.1.2 Basic PLL Topology
15.1.3 Dynamics of Simple PLL
15.2 Charge-Pump PLLs
15.2.1 Problem of Lock Acquisition
15.2.2 Phase/Frequency Detector and Charge Pump
15.2.3 Basic Charge-Pump PLL
15.3 Nonideal Effects in PLLs
15.3.1 PFD/CP Nonidealities
15.3.2 Jitter in PLLs
15.4 Delay-Locked Loops
15.5 Applications
15.5.1 Frequency Multiplication and Synthesis
15.5.2 Skew Reduction
15.5.3 Jitter Reduction
Appendix A Short-Channel Effects and Device Models
A.1 Scaling Theory
A.2 Short-Channel Effects
A.2.1 Threshold Voltage Variation
A.2.2 Mobility Degradation with Vertical Field
A.2.3 Velocity Saturation
A.2.4 Hot Carrier Effects
A.2.5 Output Impedance Variation with Drain-Source Voltage
A.3 MOS Device Models
A.3.1 Level 1 Model
A.3.2 Level 2 Model
A.3.3 Level 3 Model
A.3.4 BSM Series
A.3.5 Other Models
A.3.6 Charge and Capacitance Modeling
A.3.7 Temperature Dependence
A.4 Process Corners
A.5 Analog Design in a Digital World
Appendix B CMOS Processing Technology
B.1 General Considerations
B.2 Wafer Processing
B.3 Photolithography
B.4 Oxidation
B.5 Ion Implantation
B.6 Deposition and Etching
B.7 Device Fabrication
B.7.1 Active Devices
B.7.2 Passive Devices
B.7.3 Interconnects
B.8 Latch-Up
Appendix C Layout and Packaging
C.1 General Layout Considerations
C.1.1 Design Rules
C.1.2 Antenna Effect
C.2 Analog Layout Techniques
C.2.1 Multifinger Transistors
C.2.2 Symmetry
C.2.3 Reference Distribution
C.2.4 Passive Devices
C.2.5 Interconnects
C.3 Substrate Coupling
Index